O’Shenu Technologies delivers end-to-end solution for up-to-date advanced opto-electronic (OE) projects. O’Shenu integrated tool sets include 50–300 mm (2- to 12-inch) OE wafer level tester, defect visual inspection tool (AOI), OE die sorter (KGD) as well as OE engine assembly automation and device burning racks for reliability testing, all to submicron visual and motion control precision. The over temperature testing cut shorts well product research and development time. O’Shenu enables research institutes, pilot lines and industrial manufacturers to implement structured, repeatable and scalable device validation and product realization from wafer to packaged component supporting Silicon Photonics, SiN, III–V and TFLN material platforms.